Read OmniScan MX2 Phased Array Flaw Detector text version


OmniScan® MX2

The Standard in Phased Array, Redefined


The Standard in Phased Array, Redefined

The result of over 10 years of proven leadership in modular NDT test platforms, the OmniScan MX has been the most successful portable and modular phased array test instrument produced by Olympus to date, with thousands of units in use throughout the world.

Building on a Solid Basis

This second generation OmniScan MX2 increases testing efficiencies, ensuring superior manual and advanced AUT application performance with faster setups, test cycles, and reporting, in addition to universal compatibility with all phased array modules: past, present and future. Designed for NDT phased array leaders, this high-end, scalable platform delivers true next-generation NDT testing. The OmniScan MX2 offers a high acquisition rate and new powerful software features--in a portable, modular instrument--to efficiently perform manual and automated inspections.

Faster Is Better!

Powerstart your day the right way with the OmniScan MX2. The OmniScan MX2 simplifies and speeds up the setup process with its new Weld Overlay software feature, so you can start testing immediately. Featuring the industry-standard Phased Array User Interface with faster than ever performance, a bigger and brighter 10.4 in. screen, new and unique intuitive touch screen capabilities, and faster data transfer, enabling you to get to your next inspection quicker.

More Rugged than Ever

The OmniScan MX2 is now designed for IP66. It is built to endure the drops, spills, and abuse that typically occur in your most demanding inspection environments.

More than an Instrument --A Solution Provider

The OmniScan MX2 is an important part of your inspection solution that can be combined with other critical components to form a complete inspection system. Olympus offers a complete product range which includes phased array probes, scanners, analysis software, and accessories, which are integrated and packaged into rapidly deployable, application-specific solution packages for quick returns on your investment. In addition, Olympus offers a high-quality calibration and repair service worldwide that is backed by a team of phased array application experts to ensure you get the support you need.


Life-Size OmniScan MX2


Touch Screen Interface

The revolutionary touch screen interface offers simple and quick navigation, enhanced text input functions, and easier, faster cursor manipulation and gate setup.

Full-Screen Mode

The unique full-screen mode offers operators increased viewing comfort, in addition to better readability at a distance. This feature can be used in both acquisition and analysis mode.

Bright 10.4 in. Screen

OmniScan MX2

OmniScan MX

OmniScan MX

Weld Overlay Wizard

The Weld Overlay Wizard facilitates the creation of industry-standard weld overlays for analysis assistance and volumetric flaw placement.


OmniScan MX2 OmniScan MX OmniScan MX2

50% larger screen

100% brighter screen

Modular Instrument

Backward Compatible. Forward Compatible. An Evolving Platform for your Growing Needs.

Designed to secure both your current and future phased array investments, the OmniScan MX2 can house any Olympus phased array module--whether the reliable, field-proven models currently available, or the next-generation modules of the future. Its open architecture also supports future software updates and phased array module upgrades with configurations from 16:64M to 32:128 to ensure that your platform evolves with your testing needs, and that you get the most from your investment.

Module Compatibility


OmniScan MX2

OmniScan MX

Software Compatibility

MXU-3.X1 MXU-2.X setup and data file TomoView 2.9R71, 2 1. Older versions are not compatible with the OmniScan MX2. 2. Data file compatibility, no data acquisition.

16:64 PA M

16:64 PA 16:128 PA

32:32 PA 32:128 PA


Setting Up for Success

Touch Screen

The bright 10.4 in. screen with its revolutionary touch screen interface offers simple and quick navigation, enhanced text input functions, and easier, faster cursor navigation and gate setup.

Menu Selection and Parameter Settings

Gate Selection and Movement

In Gate mode, tap and hold on a gate to move the gate to a new position.

Tap once on the screen to quickly navigate through menus, sub-menus and parameters.

Zooming and Panning

In Cursor mode, tap once on a cursor to select it. Double-tap on a position to move the cursor to the desired location.

Text and Value Input

The touch screen's zooming functions can be used to zoom in on a specific area. In Zoom mode, tap, hold, and drag to create a selection rectangle, and then release to zoom in on the area.

In Zoom mode, swipe to pan the window contents. 6

Double-tap on a parameter to bring up the keyboard or keypad on which values can be entered.


Group Wizard for All Essential Parameters:

Material selection, with a database for shear and longitudinal velocities, and configuration of components for flat or curved surfaces. Group copy Wizard for fast creation of symmetrical two-probe inspections. Wedge selection from a database of Olympus wedges. Auto probe detection. Scanner configuration with offsets, skews, and probe positions. Wizard guidance for phased array, conventional UT, and TOFD channels. Detailed interactive illustrated help menu for every step in the Wizard. Weld Overlay and RayTracing.

Scan plan adjustment using the focal law configuration wizard.

Setup Speed

OmniScan MX OmniScan MX2

50% faster

S-Scan and A-Scan Display Refresh Rate

OmniScan MX OmniScan MX2

300% better

UT parameter adjustment using the touch screen software keypad.


Code-Compliant Calibration

The Calibration Wizards ensure that every focal law in every group is the direct equivalent of a single-channel conventional flaw detector.

Calibration Wizards

Calibration Wizards guide the user step-by-step through Velocity, Wedge Delay, Sensitivity, TCG, DAC, and DGS calibrations. Enable experimental or theoretical sensitivity and TCG curves based on 2, 3, or all beams for a real or interpolated calibration. Simple, easy-to-use interface that enables all focal laws to be visualized simultaneously for a particular calibration task. Interactive help menu with detailed graphics and definitions, which is available in each step of the Wizard.

Sensitivity calibration for a defined section in a sectorial scan.

Sensitivity calibration for all beams in a sectorial scan. 7


A scan menu for quick and easy configuration of inspection parameters for manual, one-line, raster, and helicoidal scans. Encoder configuration for clock, and one- or two-axis inspections. C-scan configuration for amplitude and position C-scans, and display setup. Data storage options for full A-scans, S-scans, and/or C-scans. Preconfigured display layouts for easy inspection preparation. PRF auto adjustments for optimized, maximum speed, or manually-controlled settings. Data storage options for flash card or USB media devices. Real-time data acquisition displays, with the ability to rewrite data in both scan directions when using an encoder. Easy-to-use interface with mechanized or semi-automated scanner systems, and simple wheel encoders.

Top: Data acquisition displaying TOFD. Right: Data acquisition displaying two phased array channels and TOFD.

Pulse Repetition Frequency (PRF)

OmniScan MX OmniScan MX2

40% better

Saving Inspection Data File to USB (speed)

OmniScan MX OmniScan MX2

Up to 400% better 160 Mb 300 Mb

Maximum File Size (Mb)

OmniScan MX OmniScan MX2


An extensive display menu for preconfigured multigroup and multiprobe inspection layouts. Data, reference, and measurement cursors for defect sizing and reporting. Extensive Readings database for trigonometry, flaw statistics on axes, volumetric position information, code-based acceptance criteria, corrosion mapping statistics, etc. All Readings are available online, or off-line when full A-scans are saved in data files. Linked displays for interactive analysis on A-scans, B-scans, S-scans, and C-scans for multigroup and multiprobe inspections. Optimized preconfigured layouts for quick and simple length, depth, and height sizing of flaws for code-based or non-codebased inspections. Interactive off-line gate repositioning.

Weld inspection display showing the position of indications in the RayTracing display.

Flawless Data Management

An SD Card is used to store data for easy transfer to a computer. The SD card can also be inserted and removed without having to reboot the unit. In addition, data can be transferred to external media using the USB 2.0 port. The OmniScan MX2 provides data transfer speeds up to 400% faster than the OmniScan MX (depending on the device used).



The OmniScan MX2 is designed to inspect, analyze and generate reports directly on the instrument, or off-line on a computer. The reports created on the OmniScan include an indication table that can be customized with additional readings and comments specific to each indication. A high resolution image of the current display is included in the report when selected. The auto-generated report contains relevant parameters for the instrument, software, calibration, UT parameters, phased array parameters, scanner setup, and flaw reporting. Up to eight readings from the original setup can be displayed using the touch screen's simple toggle operations. Reports are stored and viewed on the instrument, and can also be saved as HTML documents for use on a computer. Reports are fully customizable and come with several preconfigured templates.

Report Date 2011 / 01 / 11 OmniScan Type N/A Report Version MXU - 3.0B4T12 OmniScan Serial # OMNI- File Name PV200steph2.opd Module Type EQUX251C AMP127 Inspection Date 2010 / 12 / 20 Module Serial # OMNI- 2037 Inspection Version MXU - 3.0B4T10 Calibration Due 2011/8/12 Group 1 Setup A:70.00 Sk:090 L:001 Beam Delay 22.1 us Scale Type Compression Voltage 40 (Low) Scan Offset -81.00 mm Gate I A B TCG Point Number 1 2 3 Calculator Element Qty. Used 16 Start Angle 70.00º First Element 1 Stop Angle N/A Last Element 32 Angle Resolution N/A

Indicatio n # Scan 1 109.00 m m

11-01-13 10:20

OmniScan Repor

Save Mode Inspection Data Data File Name File####


Commen ts -

Index -11.63 mm

Group 2

Channel 55.00º

A% 67.7 %

DA^ 5.60 mm

Start (Half Path) 11.70 mm Scale Factor 12 Gain 40.35 dB Index Offset -21.50 mm Start 0.00 mm 7.00 mm 72.71 mm Position (Half Path) 0.00 mm 11.98 mm 17.88 mm

ViA^ -1.77 mm

Range (Half Path) 61.40 mm Video Filter Off Mode PE (Pulse-Echo) Skew 90.0º Width 11.00 mm 15.00 mm 11.00 mm Gain 0.0 dB 1.2 dB 5.0 dB

VsA^ 109.00 m m

Max. PRF 35 Pretrig. 0.00 µs Wave Type Shear C-scan time resolution 10.0 ns Threshold 20.00 % 50.00 % 30.00 %

A% 67.7 %

DA^ 5.60 mm

Type PA Rectification FW Sound Velocity 3240.0 m/s

Averaging Factor 1 Filter None 0.50 - 19.00 MHz Pulse Width 100.00 ns

tion of th e reading

U(m -r) 6.84 mm

S(m -r) 33.00 mm

Synchro. Pulse Pulse Pulse

The RayT racing is only a gr

aphical r


Resolution 1.0 Focal Depth 12.00 mm

________ ________ Wave Type ________ Material Velocity ________ Technicia Shear ________ n Signat ________ ure 3240.0 m/s ________ ________ ________ Law Configuration ____ ____ ________ ________ ____ ________ Contrac ________ Linear ________ tor ________ ________ ________ ________ ________ ________ ________ ________ ________ ____ ________ ________ ________ Date ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ________ ____ ________ ________ ________ ________ ________ ________ ____

Technicia n Name

s approve d by the operator.

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OmniScan Data Analysis and Reporting with TomoView

TomoViewTM is the perfect PC-based companion to the OmniScan® family of instruments, and seamlessly imports OmniScan files for advanced processing and analysis in TomoView. Displays volume-corrected views; views are fully customizable and come with several preconfigured templates. Corrects potential operator errors in acquisition parameters (incorrect skews, index offsets, etc.) by reading back raw acquisition data without altering original data. Imports and merges several OmniScan data files. For simplified interpretation, merges several groups into one.

Advanced Inspection Tools

TomoView offers advanced inspection tools to simulate, test, and prepare setups for the OmniScan. 2D matrix Pitch-and-catch, tandem Advanced focusing

TomoView offers advanced post-processing of OmniScan data. Illustrated here: weld overlay, multiple sector scans, multibeam C-scans, and merging of A-scans with Top and End views (the latter with rebound display).

Advanced Analysis Tools

The TOFD Manager performs TOFD calibration, lateral wave straightening, lateral wave removal, and the synthetic aperture focusing technique (SAFT). C-Scan Merge: Merges C-scans based on minimum or maximum amplitude, or time-of-flight (TOF). Signal-to-noise ratio (SNR): On a C-scan, this tool calculates and displays areas in which SNR is above and/or below a certain threshold.

2-D TRL phased array probe (multiple-line scan).


Creating a report in TomoView takes just a few clicks. Defects can be added into the indication-table database, the indication table can be customized with additional readings, and you can add comments specific to each indication.

Indication table built from composite inspection data.


Typical Applications

Girth Weld Inspection

The OmniScan PA is at the heart of the Olympus manual and semiautomated circumferential weld inspection solutions developed for the oil and gas industry. These phased array systems are certified to inspect tubes in compliance with ASME, API, and other code criteria. They offer superior inspection speed and detection, and facilitate the interpretation of indications.

Pressure Vessel Weld Inspection

A complete inspection of pressure vessel welds can be performed in a single scan using an OmniScan PA and a motorized scanner such as the WeldROVER. By combining TOFD and PA in a single inspection pass, a significant reduction in inspection time can be achieved as compared with conventional raster scanning or radiography. Furthermore, inspection results are available immediately, enabling you to detect problems with welding equipment and fix them right away.

Weld Inspection of Small-Diameter Pipes

When coupled with the COBRA manual scanner, the OmniScan flaw detector is capable of inspecting standard pipes ranging from 0.84 in. OD to 4.5 in. OD. With its very slim design, this manual scanner is capable of inspecting pipes in areas with limited access. Adjacent obstructions such as piping, supports, and structures can be as close as 12 mm (0.5 in.).

Manual and Semi-Automated Corrosion Mapping

The OmniScan PA with the HydroFORM scanner is designed to offer the best inspection solution for detecting wall-thickness reductions resulting from corrosion, abrasion, and erosion. In addition, this system detects mid-wall damage, such as hydrogen-induced blistering or manufacturing-induced laminations, and easily differentiates these anomalies from loss of wall thickness. In this application, phased array ultrasound technology offers superior inspection speed, data point density, and detection.

Composite Inspection

Parts made of laminate composite materials pose an inspection challenge due to their various shapes and thicknesses. Olympus offers complete solutions for the inspection of carbon fiber reinforced polymer structures. These solutions are based on the OmniScan flaw detector, the GLIDERTM scanner, and dedicated probes and wedges designed for CFRP flat panel and radius inspection.


OmniScan MX2 Specifications

OmniScan MX2 Mainframe Specifications

Overall dimensions (W x H x D) Weight 325 mm x 235 mm x 130 mm (12.8 in. x 9.3 in. x 5.1 in.) 5 kg (11 lb), including module and one battery SDHC card, most standard USB storage devices, or fast Ethernet 300 MB 3 Yes Video out (SVGA) 10/100 Mbps 2-axis encoder line (quadrature, up, down, or clock/direction) 4 digital TTL inputs, 5 V 4 digital TTL outputs, 5 V, 15 mA Remote acquisition enabled TTL, 5 V 5 V, 500 mA power output line (short-circuit protected) 3 TTL, 5 V, 15 mA 2 analog outputs (12 bits) ±5 V in 10 k 5 V TTL pace input 26.4 cm (10.4 in.) (diagonal) 800 pixels x 600 pixels 700 cd/m2 16 million TFT LCD Smart Li-ion battery 1 or 2 (battery chamber accommodates two hot-swappable batteries) Minimum 6 hours with two batteries 0 °C to 45 °C; 0 °C to 35 ºC with 32:128 PA (32 ºF to 113 ºF; 32 ºF to 95 ºF with 32:128 PA) ­20 °C to 60 °C (­4 ºF to 140 ºF) with batteries ­20 °C to 70 °C (­4 ºF to 158 ºF) without batteries 0% to 85% noncondensing No air intake; designed for IP66 Drop tested according to MIL-STD-810G 516.6

Phased Array Module Specifications (Applies to OMNI-M-PA16128*)

Overall dimensions (W x H x D) Weight Connectors Number of focal laws Probe recognition 244 mm x 182 mm x 57 mm (9.6 in. x 7.1 in. x 2.1 in.) 1.2 kg (2.6 lb) 1 OmniScan connector for phased array probes 2 BNC connectors for UT probes 256 Automatic probe recognition 16 elements 128 elements 40 V or 80 V per element Adjustable from 30 ns to 500 ns, resolution of 2.5 ns Negative square wave Less than 25 0 dB to 74 dB, maximum input signal 1.32 Vp-p 75 0.75 MHz to 18 MHz (­3 dB) Sectorial and linear Up to 8 16* 128 100 MHz (10 bits) Up to 10 kHz (C-scan) Up to 8,000 2, 4, 8, 16 RF, full wave, halfwave +, halfwave ­ Low-pass (adjusted to probe frequency), digital filtering (bandwidth, frequency range) Smoothing (adjusted to probe frequency range) Real time: 60 Hz 1 Hz to 10 kHz On 1 or 2 axes 16 (1 TCG curve per channel for focal laws) 3 Any logical combination of gates

Data Storage

Storage devices Data file size

I/O Ports

USB ports Speaker out Video output Ethernet


Aperture Number of elements


Voltage Pulse width Pulse shape Output impedance

I/O Lines

Encoder Digital input Digital output Acquisition on/off switch Power output line Alarms Analog output Pace input


Gain Input impedance System bandwidth


Scan type Group quantity Active elements Elements


Display size Resolution Brightness Number of colors Type

Data Acquisition

Digitizing frequency Maximum pulsing rate

Data Processing

Number of data points Real-time averaging Rectifier Filtering Video filtering

Power Supply

Battery type Number of batteries Battery life Operating temperature range Storage temperature range Relative humidity Shockproof rating

Environmental Specifications

Data Visualization

A-scan refresh rate

Data Synchronization

On internal clock On encoder Number of points

Programmable Time-Corrected Gain (TCG) Alarms

Number of alarms Conditions Analog outputs 2 * Models 16:16, 16:16M, 16:64, 16:64M, 32:32, and 32:128 also available.

Compatible with the Following Inspection Codes:

The OmniScan MX2 is compatible with standard industry inspection codes, including, but not limited to: ASME Section V, Article 4 All ASME phased array code cases ASTM E2700-09 ASTM 2591 ASTM E2491-06 AWS API 1104 and API RP2X CEN EN 583-6 BSI BS7706 ... and more


Global Presence, Local Assistance

Olympus has an extensive network of direct sales branches and representatives located in many industrial regions around the world. Answers to your questions on products, applications, training, and technologies are just one phone call or e-mail away from our dedicated staff members.

Customer Service

Olympus is committed to providing the best technical support and after-sales service to reliably meet your needs in a prompt and supportive fashion. Our professionally staffed service centers are dedicated to helping customers with repair or calibration throughout the life cycle of equipment.

Olympus NDT Training Academy

The unique Olympus NDT Training Academy offers comprehensive courses in phased array technology and applications. Courses range from a two-day "Introduction to Phased Array" program to a two-week, in-depth "Level II Phased Array" course. In all cases, students experience practical training using the portable OmniScan® phased array unit. Courses are currently being offered at the training facilities of participating companies, in addition to customer-determined locations worldwide. Customized courses can also be arranged.

Phased Array Testing Field Guide

Phased Array Testing

Basic Theory for ions Industrial Applicat

s NDT Field Guide

Olympus' new Phased Array Testing field guide is a convenient resource for customers and anyone else interested in phased array technology. It is designed to be an easy-to follow introduction to ultrasonic phased array testing, both for newcomers and more experienced users who wish to review the basic principles. This guide begins by explaining what phased array testing is and how it works, outlines some considerations for selecting probes and instruments, and concludes with further reference information and a phased array glossary. This free field guide can be obtained from your local sales representative.

Understanding Phased Array Technology Poster


Types of Probes

Probe elements

Incident wave front Pulses Trigger

Acquisition unit

Phased array unit

Basic Concepts

Angle Beam

lled excitation (amplitude testing is the computer-contro piezocomposite elements of multiple array ultrasonic such as feature of phased probe. The excitation modifying beam parameters The distinguishing elements in a multielement of dynamically by means of constructive and delay) of individual ultrasonic beam with the possibilityTo generate a beam in phase the echo from times. Similarly, can generate a focused focal spot size through software. received by at slightly different and elements are pulsed a computable time shift. The echoes angle, focal distance, emphasizes the with various active transducer is an A-scan that transducer elements interference, the The resulting sum piece. point hits the various being summed together. points in the test the desired focal time-shifted before and attenuates echoes from other each element are desired focal point response from the


Transmitting delays


Reflected wave front Echo signals


Receiving delays and sum


laws Examples of focal

Delay (ns) PA probe


FD = 15


Delay (ns) PA probe

Angle steering

FD = 15


Time delay [ns]

FD = 30


FD = 30



FD = 60

FD = 60

and depth scanning Delay values (left) a 32-element linear for principles (right) at 15-mm, 30-mm, array probe focusing waves. and 60-mm longitudinal


are used with a Angle beam probes wedge to transmit removable or integrated into or longitudinal wave a refracted shear a wide are designed for a test piece. They to and can be used range of applications skew beam angle or the vary the refracted on the wedge of the beam, depending probe face is acoustically orientation. The material. matched to the wedge

Incident wave front

0 0 4 8 12 16





Element number

Incident wave front

Integrated Wedge focusing Dynamic depth is a programmable, real-time array (DDF)

Illustration of beam


Illustration of beam


Scanning Patterns

scanning Electronic linearsingle focal law is multiplexed across a

or angular (also called azimuthal for a With sectorial scanningmoved through a sweep range is sweep scanning), the beam using the same elements; other a constant scanning, angular is performed at With electronic specific focal depth, focal depths may be added. The This elements; scanning a group of active probe length (aperture). ranges with different values. the phased array transducer performing sectors may have different angle and along If a conventional ultrasonic or shear-wave inspection. is equivalent to for different corrosion mapping a raster scan for laws compensate is used, the focal an angled wedge the wedge. time delays inside

Active group

16 128 1

Sectorial scanning

delay, by modifying the Dynamic depth focusing ption accomplished a function of time. DDF as response-on-rece of each element created by gain, and excitation same focal range focal laws for the beams" at the receiving replaces multiple distance with separate "focused changes the focal the emitted beam DDF dynamically significantly stage. In other words, the phased array probe. DDF to as the signal returns field and signal-to-noise ratio. of increases the depth

Pulse-echo Reception Emission

an angle beam probe This variation of into the probe integrates the wedge fixed configuration is housing. The wedge overall dimensions. but offers smaller

Delay (ns) PA probe

t0 t1 t2 t3 tn


Near Wall

Acquisition time

Scanning direction

Acquisition without Sectorial scanning Electronic linear scanning


Acquisition with


is specifically designed The near wall probe zone at probe ends to minimize the dead between the last by reducing the distance external edge of and the available element for probe type is useful the housing. This and corner inspections, composite radius requiring close contact or any application wedge. to a wall using a 0°


Web Based Tutorial

The tutorial offered by Olympus provides a basic introduction to the main theories used to make our instruments. These tutorials also present typical applications pertaining to the various markets in which Olympus instruments are used.

Phased Array Probes

one of applications. Thus, probes for industrial used phased array the most commonly is the active probe aperture. Linear arrays are the following formula: of linear arrays length is given by the important features e probe length. Aperture (A) is the total active The active aperture PA probe A = (n ­ 1) p + e of elements in the of where n = Number between the centers Wpassive p = Elementary pitch--distance two adjacent elements a single piezocomposite of e = Element width--width value is e < /2) element (a practical adjacent elements g = Gap between =v f

p A

for of shapes and sizes are made in a variety Phased array probes A few types are illustrated here: different applications.

To support the growing NDT community, Olympus has published the "Understanding Phased Array Technology" poster. This poster was designed by field experts to present phased array inspection technology in a concise and clearly illustrated manner. This free poster can be obtained from your local sales representative, or directly from our website.


1.5-D array

2-D array





Internal focus



Variable angle

Dual linear

Dual 1.5-D


= Wavelength velocity v = Material sound f = Frequency


are designed to Immersion probes wedge or in an be used with a water is when the test part immersion tank immersed. The water partially or wholly line. couplant and delay acts as a uniform are longitudinal-wave Immersion probes be set up for refracted probes that can under water. shear-wave inspection are mostly intended Immersion probes for automated inspections.

Arrays 2-D and 1.5-D have multiple arrays


70° 60° 45°


70° 60° 45° 60° 45° 45° 60° 70° 70° 60° 45°


70° 70° 45° 60°

Two-dimensional to allow electronic strips of linear arrays in both probe focusing and steering have the same number axes. 2-D arrays dimensions, of elements in both probes with whereas 1.5-D identifies of of uneven numbers any combination can be used for elements. The probes or focusing capability achieving optimal area without probe to cover a defined movement.

to create curves (DAC) used Distance-amplitudegain (TCG) the time-corrected

of the part with the whole volume In order to cover be calibrated for focal law has to consistency, each time-correctedbeam spread. This with a attenuation and can be performed gain (TCG) calibration several identical reflectors having depths. calibration block holes) at different (for example, side-drilled probe is moved back scan, the reflector. The Using a sectorial each beam hits each (DAC) and and forth so that signal is recorded focal law. amplitude of each one TCG curve per used to construct

As individual TCG curve.its focal law has one regardless of is completed, each signal amplitude, in depth detected Once the TCG calibration will always yield the same A defect at 3 mm and a reflector that detected it. a consequence, it were at 10 mm part and of the beam the same signal amplitude as if position inside the will provide 45 degrees with an angle of detected at 60 degrees.

Dual Arrays array probes can two 1.5-D

Defect Positioning



Two linear or a roof-angled wedge be positioned on is probe. The probe with a transmitting equivalent for paired with a receiving in noisy materials optimal performance steel. This configuration such as austenitic equivalent to a dualis a phased-array and conventional UT element probe in the power-generation is widely used in industry.

Academy Olympus NDT Training is available from

Phased array training professional companies. .com Visit www.olympus-ims



45° T1 Top

are essential to quickly real-time readings probe location. For manual inspections, geometry and/or respect to the part

position the reflected

signal source with

the user to accurately SA readings allow an inspection. RA, PA, DA, and in real time during position the defect in gate A to the indication RA: Reference point in gate A face to the indication PA: Probe front A indication in gate DA: Depth of the in gate A length to the indication SA: Sound-path

All rights reserved. by Olympus NDT. Copyright © 2006­2009 Poster_PA_EN_200906 920-172A_EN -


decade for more than a array technology The leader in phased

48 Woerd Avenue, Waltham, MA 02453, USA, Tel.: (1) 781-419-3900 12569 Gulf Freeway, Houston, TX 77034, USA, Tel.: (1) 281-922-9300 505, boul. du Parc-Technologique, Québec (Québec) G1P 4S9, Tel.: (1) 418-872-1155 1109 78 Ave, Edmonton (Alberta) T6P 1L8

[email protected]


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