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Engineering and Testing for EMC and Safety Compliance

ACA CLASS B COMPLIANCE REPORT

SanDisk Corporation 7 Atir Yeda Street Kfar Saba, Israel 972-9-7644908 Contact: Eitan Chalfon

SanDisk SSD UATA 5000 1.8"

February 7, 2007

Report Prepared By: EMC Lab Coordinator: Jon Wilson

Rhein Tech Laboratories, Inc.

DOCUMENT NUMBER: 2006137 CLIENT REFERENCE NUMBER: QRTL06-334

This report may not be reproduced, except in full, without the written approval of Rhein Tech Laboratories, Inc

360 Herndon Parkway, Suite 1400 Herndon, VA 20170 Phone: 703-689-0368; Fax: 703-689-2056; Metro: 703-471-6441

RHEIN TECH LABORATORIES, INC.

COMPLIANCE FOLDER

STATEMENT OF COMPLIANCE

For full test results refer to Rhein Tech Laboratories, Inc. endorsed TEST REPORT No.: 2006137 Client: SanDisk Corporation, Inc. Address: 7 Atir Yeda Street Kfar Saba, Israel 972-9-7644908 Equipment Identification Type of Equipment: Information Technology Equipment Equipment Models: SanDisk SSD UATA 5000 1.8" Equipment Serial Number: N/A Equipment Description: ATA Storage Device Supplier/Manufacturer: SanDisk Corporation, Inc. Relevant standards against which equipment was tested: AS/NZS CISPR22:2004 Class B Exclusions: None Relevant Advice to Industry DATED: February 7, 2007 already supplied to the client

The Rhein Tech Laboratories, Inc. test house, AUSTEL listing number A97/TH/0107, states that the customer equipment referred to in the above mentioned Test Report complies in all respects with the appropriate requirements of standards listed above. The conditions in relation to the Degrees of Uncertainty as accepted by NVLAP (National Voluntary Laboratory Accreditation Program) has been noted and taken into account in making this statement. I, being the NVLAP registered signatory for test reports prepared against the above standards, and therefore the authorized signatory to the Test Report, declare that the information given is true and correct. This Statement of Compliance is issued in accordance with the terms of our accreditation. No modifications were made during testing.

Signed: Jon Wilson, EMC Lab Coordinator

Dated: February 7, 2007

® Accredited by the National Voluntary Accreditation Program for the specific scope of accreditation under Lab Code 20061-0.

DECLARATION OF CONFORMITY

WITH AUSTEL TECHNICAL STANDARDS

NUMBER: 2006137

I/We of (name of company representative responsible for the permit) (Australian Company or Agent Name)

Australian Company Name (ACN)________________________________ hereby declare, under our sole responsibility, that all product supplied by this organization is customer equipment of the same type as that for which the permit/verification of permit was issued.

I/We agree to allow ACA access to, and removal of, the Compliance Folder for ongoing compliance audit purposes, in accordance with agreed administrative process. Information about the person making this Declaration. (The person making this Declaration must hold a suitably responsible position in the above organization)

(Signature of the person making this Declaration)

(Full Name of the Above Person)

(Position held in the company)

(Date of Declaration)

Sample ACA Certificate

Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

TABLE OF CONTENTS

1 GENERAL INFORMATION/TEST FACILITY AND METHODOLOGY ................................................ 5 1.1 1.2 2 DEVIATIONS ...................................................................................................................................... 5 ACCREDITATION STATEMENTS ........................................................................................................... 5

SYSTEM TEST CONFIGURATION ...................................................................................................... 6 2.1 2.2 2.3 2.4 2.5 2.6 PRODUCT DESCRIPTION .................................................................................................................... 6 MODIFICATIONS ................................................................................................................................ 6 TESTED SYSTEM DETAILS ................................................................................................................. 7 CONFIGURATION PHOTOGRAPH OF SYSTEM UNDER TEST ................................................................... 8 EUT EXERCISE DESCRIPTION............................................................................................................ 8 SPECIAL ACCESSORIES ..................................................................................................................... 8

3

PRODUCT LABELING.......................................................................................................................... 9 3.1 3.2 C-TICK MARK ................................................................................................................................... 9 LABEL LOCATION............................................................................................................................. 10

4

MEASUREMENT PHOTOGRAPHS ................................................................................................... 11 4.1 4.2 CONDUCTED MEASUREMENT PHOTOGRAPHS ................................................................................... 11 RADIATED MEASUREMENT PHOTOGRAPHS ....................................................................................... 12

5 6

CONDUCTED EMISSIONS................................................................................................................. 13 RADIATED EMISSIONS ..................................................................................................................... 14 6.1 6.2 RADIATED EMISSIONS TEST RESULTS .............................................................................................. 14 FIELD STRENGTH CALCULATION....................................................................................................... 15

7 8 9

EQUIPMENT LIST............................................................................................................................... 16 USER'S MANUAL ............................................................................................................................... 16 CONDUCTED AND RADIATED TEST METHODOLOGY ................................................................. 17 9.1 9.2 CONDUCTED EMISSIONS MEASUREMENTS ........................................................................................ 17 RADIATED EMISSIONS MEASUREMENTS............................................................................................ 17

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

1

GENERAL INFORMATION/TEST FACILITY AND METHODOLOGY

The following Class B Application for ACA Compliance is prepared on behalf of SanDisk Corporation, Inc.. in accordance with AS/NZS CISPR22:2002. The Equipment Under Test (EUT) was the SanDisk SSD UATA 5000 1.8". The test results reported in this document relate only to the item that was tested. All measurements contained in this Application were conducted in accordance with AS/NZS CISPR22:2002. The instrumentation utilized for the measurements conforms with the CISPR 22 Specification for Radio Disturbance and Immunity Measuring Apparatus and Methods. Some accessories are used to increase sensitivity and prevent overloading of the measuring instrument. These are explained in the appendix of this report. Calibration checks are performed regularly on the instruments, and all accessories including the high pass filter, preamplifier and cables. All radiated and conducted emissions measurements were performed manually at Rhein Tech Laboratories, Inc. The radiated emissions measurements required by the rules were performed on the ten meter, open field, test range maintained by Rhein Tech Laboratories, Inc., 360 Herndon Parkway, Suite 1400, Herndon, Va., 20170. Complete description and site attenuation measurement data have been placed on file with the Federal Communications Commission (FCC) and the National Voluntary Laboratory Association Program (NVLAP). The power line conducted emission measurements were performed in a shielded enclosure also located at the Herndon, Virginia facility.

1.1

DEVIATIONS

There were no deviations from the test standard(s) and/or methods. 1.2

ACCREDITATION STATEMENTS

· NVLAP · US

(USA): Accreditation under NVLAP Lab Code: 200061-0

CAB: Recognition as of U.S. Conformity Assessment Body (CAB) for EMC testing under US-EU and USAPEC MRA; IC accepted CAB under Phase I of APEC Telecommunication MRA. Identification number US0079. (USA): Listing of test sites, Registration # 90902

· FCC · IC

(Canada): Listing of test sites, IC 2956-1 and IC 2956-2 TCB (ATCB): Certification of cooperation, granted in 2005

· US · CE

Notified Body: Rhein Tech Laboratories, Inc. has been approved by TNO Certification B.V. to provide EMC Test Reports and Technical Construction Files to TNO Certification B.V. Rheintech Certification number: 10118957 (Australia): Acceptance as of a Listed Test House, A97/TH/0107 (Brazil, telecommunication): NCC certification for performing tests

· AUSTEL · ANATEL · Ministry · VCCI · BSMI

of Commerce (New Zealand): Approval of a test laboratory: ECR 3-9 BAE

(Japan): Approval and registration of RTL test sites as R-1113 and C-1172

Rhein Tech Labs has been validated by the Chinese Taipei Bureau of Standards, Metrology, and Inspection (BSMI) under the Asia Pacific Economic Cooperation Mutual Recognition Arrangement (APEC MRA). BSMI number: SL2-IN-E-055R. testing sites are recognized by the VCCI and registered under Numbers R-1113 and C-1172

· RTL's

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

2

2.1

SYSTEM TEST CONFIGURATION

PRODUCT DESCRIPTION

SanDisk SSD UATA 5000 1.8" is a drop-in replacement for the hard disk drive. It has no moving/ mechanical parts. Small form factor o 1.8" small form factor supporting unformatted capacity of 32GB o 8mm case height o Zero Insertion Force (ZIF) connector Interface to host o Standards: ATA-2/ATA-3/ATA-4/ATA-5/ATA-6/ATA-7 High performance o Host transfer rate: 100MB/s o Internal transfer read rate: 62MB/s o Internal transfer write rate: 36MB/s o Average access time: 0.11msec Low power consumption o Supply voltage: 3.3Vdc o Typical read/write: 140mA o Typical idle: 65mA o Typical standby: 20mA o Typical sleep: 10mA Reliability o Mean time between failure (MTBF): 2,000,000 hours, based on RDT per Weibull method o Operating shock: 1,500G, 0.5msec half sine o Operating vibration: 2.17G, 7-800 Hz o Operating temperature: 0°C to 70°C o Non operating temperature and storage: -55°C to 95°C

2.2

None

MODIFICATIONS

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

2.3

TESTED SYSTEM DETAILS

Listed below are the identifiers and descriptions of all equipment, cables, and internal devices used with the EUT for this test.

Equipment Under Test

Part Manufacturer Model Serial Number 6C3C213 FCC ID DoC Cable Description Internal RTL Bar Code 017740 Equipment Arrival Date 01/08/2007

ATA Storage Device

SanDisk Corporation

SanDisk SSD UATA 5000 1.8"

Auxiliary Equipment

Part Manufacturer Model Serial Number CND3520M69 CN-0DF263716156822ED4 CN-OUC79342940-68P0053 CN-02320V47781-07J0888 Rev 1.0 700358 F258219 FCC ID DoC N/A Cable Description Unshielded Power Unshielded RTL Bar Code 017739 017737 Equipment Arrival Date 01/08/2007 01/08/2007

Laptop PC Laptop AC Adapter

Dell Dell

Latitude D420PP09S LA65NS0-00

DVD Player

Dell

PD01S Multimedia Speaker System USB PCB Telex 134

DoC

Shielded

017738

01/08/2007

Speaker USB Termination Microphone Ethernet hub

harman/kardon Gateway, Inc. Gateway, Inc. Flowpoint

N/A N/A N/A

Class A Device

Unshielded Shielded Unshielded Unshielded Power

012542 008645 016989 901278

09/22/2000 04/07/1997 01/24/2006 10/04/2002

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

2.4

CONFIGURATION PHOTOGRAPH OF SYSTEM UNDER TEST

Speaker

Microphone

Laptop PC with SanDisk SSD UATA 5000

USB Termination

DVD Player

2.5

EUT EXERCISE DESCRIPTION

The SanDisk SSD UATA 5000 1.8" was installed in a Class B laptop personal computer which was running Windows XP. The computer was programmed to transfer files continuously, to and from the device under test using a software application provided by Dell. The SanDisk SSD UATA 5000 1.8" was tested as a representative of the full line of available capacities. The only difference among the different sizes is the on-board flash memory. Otherwise, there are no physical, clock, or electronic changes. Determination of the 1.8 as the "worst case" test sample was determined by SanDisk based on preliminary scanning of the devices under test and engineering judgement that: because of the small changes between the various capacities, any changes in emission amplitudes or EMC susceptibility would be inconsequential.

2.6

SPECIAL ACCESSORIES

The end user is advised to use the same type cables mentioned in this test report.

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

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3.1

PRODUCT LABELING

C-TICK MARK

The compliance label indicates that the product complies with the applicable standard and establishes a traceable link between the equipment and the manufacturer, importer or their agent responsible for compliance and for placing it on the Australian market. The requirements for labelling for specified electrical or electronic items are:

The mark to be used exactly as shown in the Radiocommunications (Compliance Labelling - Incidentals Emissions) Notice. No variations are permitted. the mark and supplier identification should be a permanent feature placed on the external surface of the product as near as practical to the model identification. Where this is not practical, due to the size or nature of the product, the label may be placed on the labelling, packaging, warranty or instructions of the product. the label shall be durably applied by any suitable means such as printing, painting, moulding, etching or engraving. the mark shall be legible and visible to the unaided eye no smaller than 3mm in diameter, with supplier identification characters no less than 1mm in height. the label may be reproduced in any colour provided that visibility is assured through either contrast with the background colour or marking in relief (moulding, engraving etc).

Location

Method of marking Scale

Colour

Note The C-Tick mark is a protected symbol for section 188A of the Radiocommunications Act 1992.

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

3.2

LABEL LOCATION

Label Location

Bottom of SanDisk SSD UATA 5000 1.8"

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

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4.1

MEASUREMENT PHOTOGRAPHS

CONDUCTED MEASUREMENT PHOTOGRAPHS

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

4.2

RADIATED MEASUREMENT PHOTOGRAPHS

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

5

CONDUCTED EMISSIONS

Temperature: 74°F S i t e Emission Level Correction (dBuV) Factor (dB) 0.2 46.5 0.2 39.9 0.3 33.7 0.7 34.0 1.1 35.3 2.5 27.6 Humidity: 40% CISPR B CISPR B QP QP Limit Margin (dBuV) (dBuV) 65.1 -18.6 61.7 -21.8 59.4 -25.7 56.0 -22.0 56.0 -20.7 60.0 -32.4

Neutral Conductor

Emission Frequency (MHz) 0.168 0.253 0.331 1.650 3.950 17.670 T e s t Detector Analyzer Reading (dBuV) 46.3 39.7 33.4 33.3 34.2 25.1 CISPR B AV Limit (dBuV) 55.1 51.7 49.4 46.0 46.0 50.0 CISPR B AV Margin (dBuV) -8.6 -11.8 -15.7 -12.0 -10.7 -22.4 Pass/ Fail

Pk Pk Pk Pk Pk Pk

Pass Pass Pass Pass Pass Pass

Phase Conductor

Emission Frequency (MHz) 0.157 0.176 0.298 0.331 3.720 9.640 28.820 T e s t Detector Analyzer Reading (dBuV) 46.9 46.5 38.1 36.6 37.1 30.4 25.6 Temperature: 74°F S i t e Emission Level Correction (dBuV) Factor (dB) 0.2 47.1 0.2 46.7 0.3 38.4 0.3 36.9 1.1 38.2 1.9 32.3 3.1 28.7 Humidity: 40% CISPR B CISPR B QP QP Limit Margin (dBuV) (dBuV) 65.6 -18.5 64.7 -18.0 60.3 -21.9 59.4 -22.5 56.0 -17.8 60.0 -27.7 60.0 -31.3 CISPR B AV Limit (dBuV) 55.6 54.7 50.3 49.4 46.0 50.0 50.0 CISPR B AV Margin (dBuV) -8.5 -8.0 -11.9 -12.5 -7.8 -17.7 -21.3 Pass/ Fail

Pk Pk Pk Pk Pk Pk Pk

Pass Pass Pass Pass Pass Pass Pass

Result: PASS Test Personnel: Jon Wilson Tester January 8, 2007 Date of Test

Signature

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

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6.1

RADIATED EMISSIONS

RADIATED EMISSIONS TEST RESULTS

Temperature: 50°F Humidity: 68% Turntable Antenna Analyzer S i t e Emission Azimuth Height Reading Correction Level (deg) (m) (dBuV) (dBuV/m) Factor (dB/m) 355 1.5 29.8 -15.6 14.2 220 1.0 36.8 -16.0 20.8 300 1.4 39.1 -16.1 23.0 145 1.0 42.1 -16.4 25.7 330 1.0 32.6 -16.1 16.5 160 1.0 40.9 -12.2 28.7 190 1.0 37.3 -9.4 27.9 280 1.0 35.3 -8.3 27.0 269 2.2 36.4 -4.6 31.8

Emission Frequency (MHz) 141.950 166.200 167.988 191.990 211.994 249.994 335.985 365.785 479.989

T e s t Detector

Antenna Polarity (H/V) V V V V V V V V H

Limit (dBuV/m) 30.0 30.0 30.0 30.0 30.0 37.0 37.0 37.0 37.0

Margin (dB) -15.8 -9.2 -7.0 -4.3 -13.5 -8.3 -9.1 -10.0 -5.2

Pass/ Fail

Qp Qp Qp Qp Qp Qp Qp Qp Qp

Pass Pass Pass Pass Pass Pass Pass Pass Pass

Result: PASS Test Personnel: Jon Wilson Tester January 8, 2007 Date of Test

Signature

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

6.2

FIELD STRENGTH CALCULATION

The field strength is calculated by adding the Antenna Factor and Cable Factor, and subtracting the Amplifier Gain (if any) from the measured reading. The basic equation with a sample calculation is as follows:

FI(dBuV/m) = SAR(dBuV) + SCF(dB/m) FI = Field Intensity SAR = Spectrum Analyzer Reading SCF = Site Correction Factor

The Site Correction Factor (SCF) used in the above equation is determined empirically, and is expressed in the following equation: SCF(dB/m) = - PG(dB) + AF(dB/m) + CL(dB) SCF = Site Correction Factor PG = Pre-amplifier Gain AF = Antenna Factor CL = Cable Loss The field intensity in microvolts per meter can then be determined according to the following equation: FI(uV/m) = 10FI(dBuV/m)/20

For example, assume a signal at a frequency of 125 MHz has a received level measured as 49.3 dBuV. The total Site Correction Factor (antenna factor plus cable loss minus preamplifier gain) for 125 MHz is -11.5 dB/m. The actual radiated field strength is calculated as follows: 49.3 dBuV - 11.5 dB/m = 37.8 dBuV/m

37.8/20

10

= 101.89 = 77.6 uV/m

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

7

EQUIPMENT LIST

The following is a list of equipment Rhein Tech uses to perform testing.

Part Type Spectrum Analyzer (100Hz-.15GHz) Spectrum Analyzer Display Section Quasi-Peak Adapter Filter 16A LISN 16A LISN Current Probe (Telecom conducted) Emissions testing software Spectrum Analyzer (100Hz-.15GHz) Spectrum Analyzer Display Section Quasi-Peak Adapter Amplifier Bi-Log Antenna (20MHz-2GHz) Emissions testing software Manufacturer Model Conducted Emissions (SR2, SA3) Hewlett Packard 8567A Hewlett Packard 85662A Hewlett Packard 52022-910E Solar 8130 AFJ International LS16/110VAC AFJ International LS16/110VAC Fischer Custom Communications F-33-1 Rhein Tech Laboratories, Inc. Automated Emission Tester Radiated Emissions Hewlett Packard 8567A Hewlett Packard 85662A Hewlett Packard 52022-910E RTL PR-1040 Schaffner Chase CBL6112B Rhein Tech Laboratories, Inc. Automated Emission Tester Serial Number 2727A00535 2816A16471 119044-189 947306 16010020082 16010020080 3003 Rev. 14.0.2 2727A00535 2816A16471 119044-189 1003 2648 Rev. 14.0.2 Barcode 900897 900896 900099 900729 901084 901083 900894 N/A 900897 900896 900099 900811 901053 N/A Cal Due Date 3/3/2007 3/3/2007 3/7/2007 N/A 1/23/2007 3/29/2007 3/22/2007 N/A 3/3/2007 3/3/2007 3/7/2007 3/15/2007 11/1/2007 N/A

8

USER'S MANUAL

< will be filed with this report >

Compliance Report

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

9

9.1

CONDUCTED AND RADIATED TEST METHODOLOGY

CONDUCTED EMISSIONS MEASUREMENTS

The power line conducted emission measurements were performed in a Series 81 type shielded enclosure manufactured by Rayproof. The EUT was assembled on a wooden table 80 centimeters high. Power was fed to the EUT through a 50 ohm / 50 microhenry Line Impedance Stabilization Network (EUT LISN). The EUT LISN was fed power through an A.C. filter box on the outside of the shielded enclosure. The filter box and EUT LISN housing are bonded to the ground plane of the shielded enclosure. A second LISN, the peripheral LISN, provides isolation for the EUT test peripherals. This peripheral LISN was also fed A.C. power. A metal power outlet box, which is bonded to the ground plane and electrically connected to the peripheral LISN, powers the EUT host peripherals. The spectrum analyzer was connected to the A.C. line through an isolation transformer. The 50-ohm output of the EUT LISN was connected to the spectrum analyzer input through a Solar 7 kHz high-pass filter. The filter is used to prevent overload of the spectrum analyzer from noise below 7 kHz. Conducted emission levels were measured on each current-carrying line with the spectrum analyzer operating in the CISPR quasi-peak mode (or peak mode if applicable). The analyzer's 6 dB bandwidth was set to 9 kHz. No video filter less than 10 times the resolution bandwidth was used. Average measurements are performed in linear mode using a 10 kHz resolution bandwidth, a 1 Hz video bandwidth, and by increasing the sweep time in order to obtain a calibrated measurement. The emission spectrum was scanned from 150 kHz to 30 MHz. The highest emission amplitudes relative to the appropriate limit were measured and have been recorded in this report.

9.2

RADIATED EMISSIONS MEASUREMENTS

Before final measurements of radiated emissions were made on the open-field three/ten meter range, the EUT was scanned indoor at one and three meter distances. This was done in order to determine its emissions spectrum signature. The physical arrangement of the test system and associated cabling was varied in order to determine the effect on the EUT's emissions in amplitude, direction and frequency. This process was repeated during final radiated emissions measurements on the open-field range, at each frequency, in order to insure that maximum emission amplitudes were attained. Final radiated emissions measurements were made on the three/ten-meter, open-field test site. The EUT was placed on a nonconductive turntable 0.8 meter above the ground plane. The spectrum was examined from 30 MHz to 1000 MHz. At each frequency, the EUT was rotated 360°, and the antenna was raised and lowered from 1 to 4 meters in order to determine the emission's maximum level. Measurements were taken using both horizontal and vertical antenna polarizations. For frequencies between 30 and 1000 MHz, the spectrum analyzer's 6 dB bandwidth was set to 120 kHz, and the analyzer was operated in the CISPR quasi-peak detection mode. For emissions above 1000 MHz, emissions are measured using the average detector function with a minimum resolution bandwidth of 1MHz. No video filter less than 10 times the resolution bandwidth was used. The highest emission amplitudes relative to the appropriate limit were measured and recorded in this report. Note: Rhein Tech Laboratories, Inc. has implemented procedures to minimize errors that occur from test instruments, calibration, procedures, and test setups. Test instrument and calibration errors are documented from the manufacturer or calibration lab. Other errors have been defined and calculated within the Rhein Tech quality manual, section 6.1. Rhein Tech implements the following procedures to minimize errors that may occur: yearly as well as daily calibration methods, technician training, and emphasis to employees on avoiding error.

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Company Name: Eut: Client Reference Number: Work Order Number:

Sandisk Corporation SanDisk SSD UATA 5000 1.8" QRTL06-334 2006137

Compliance Report

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